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Flash Memory Chip Intelligent Test Equipment

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Flash Memory Chip Intelligent Test Equipment

Flash Memory Chip Intelligent Test Equipment
Flash Memory Chip Intelligent Test Equipment

Large Image :  Flash Memory Chip Intelligent Test Equipment

Product Details:
Place of Origin: China
Brand Name: Haida
Certification: CE,ISO
Model Number: HD-N8-NAND
Payment & Shipping Terms:
Minimum Order Quantity: 1set
Price: US$5,000.00-13,000.00 / Piece
Packaging Details: Strong Wooden Case
Delivery Time: 8 Days After Order
Payment Terms: L/C, D/A, D/P, T/T, Western Union, MoneyGram
Supply Ability: 150 Sets/Months

Flash Memory Chip Intelligent Test Equipment

Description
Operating Temperature Range: -30ºC~150ºC Storage Temperature Range: -20ºC~60ºC
Operating Humidity Range: 45%~75% Equipment Size: W400×H510×D520mm

Flash Memory Chip Intelligent Test System

Product Description:

  1. The Smart Test System YC-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
  2. It supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.


Product Specifications:

  1. Tested by JEDEC Stand No. 218: Solid State Technology Association B-2016 Solid-State Drive (SSD) Requirements And Endurance Test Motho;
  2. Test basis following JEDEC Standard No. 47 NVCE: Solid State Technology Association Stress-TestDriven Qualification of Integrated Circuits;
  3. Test board design specifications to meet industrial-grade test temperature environment requirements;


Technical Specifications:

Physical properties
Equipment size W400×H510×D520mm
Power supply method AC
Operating voltage range AC(220±10%)V single-phase 2-wire + protective earth
Normal working power consumption 2KW
Operating temperature range -30ºC~150ºC
Storage temperature range -20ºC~60ºC
Operating Humidity Range 45%~75%
System performance
Number of particles that can be tested in parallel 1~8 pcs
Supported flash brands for testing SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
Package sizes supported BGA152, BGA132 (custom extensions available)
Supported Flash Protocol Types ONFI/toggle interface particles
Supported Voltage Hardware support V1.2, V1.8 optional
Supported Voltage Pull-Off Range Software support can be fine-tuned vcc2.3~3.6
vccq1.2 1.15~1.25
vccq1.8 1.70~1.95
Supports optional test ranges Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
Support pattern All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
Support for test command types Flash Memory Information Inspection
Flash Memory Performance Testing
Life Testing and Prediction
Quality Class Classification
Data Interference Testing
Data Retention Testing
Read-Retry Functionality
Lifetime Testing and Prediction
ECC Customisation
Parallel test speed As an example of a long-lived wellington pellet base test:
Balanced mode: 128GB *8 pellets approx. 1 hour
Full mode: 128GB*8 pellets approx. 2 hours
High-speed mode: 128GB*8 pellets approx. 20 minutes
Intelligent test module Basic tests
Experimental Tests
Advanced tests


Our Company Introduction:
HAIDA INTERNATIONAL is a professional manufacturer of various kinds of testing equipments over 24 years. HAIDA products are widely used in paper products, packaging, ink printing, adhesive tapes, bags, footwear, leather products, environment, toys, baby products, hardware, electronic products, plastic products, rubber products and other industries, and applicable to all scientific research units, quality inspection institutions and academic fields.

Flash Memory Chip Intelligent Test Equipment 0

Contact Details
Hai Da Labtester

Contact Person: Kelly

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