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Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

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Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber
Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

Large Image :  Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

Product Details:
Place of Origin: China
Brand Name: Haida
Model Number: HD-512-NAND
Payment & Shipping Terms:
Minimum Order Quantity: 1set
Price: 5000-12000 USD
Packaging Details: Strong Wooden Case
Delivery Time: 30 Days After Order
Payment Terms: L/C, D/A, D/P, T/T, Western Union, MoneyGram
Supply Ability: 150 Sets/Months

Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

Description
Display: Color LCD Display Operation Mode: Program Mode, Fixed Value Mode
Temperature Uniformity: ≤±2℃ Heating Rate: 5℃/min(mechanical Cooling, Under Standard Load)
High Light:

Accelerated Aging Comprehensive Flash Memory Test System

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Low Temperature Flash Memory Test System

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Low Temperature Accelerated Aging Chamber

Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber

 

product Specification

Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.

 

Flash memory chip intelligent test system YC-512-NAND supports multiple test patterns and custom test parameter functions, and can provide one-click basic test process and high-level test process with high flexibility, not only can realize the remaining life of flash memory particles, actual measurement , data retention and read interference and other functional tests can also help users verify the reliability status of flash memory particles. After the test is completed, the test report can be easily and quickly exported with one key, providing customers with the most intuitive and accurate graphical test data. Provide the most intuitive data reference for the grade classification and application of flash memory particles, and realize intelligent classification based on the quality inspection results of flash memory particles.

 

※ The test basis complies with JEDEC Stand No.218: Solid State Technology Association B-2016 Solid-State Drive(SSD) Requirements And Endurance Test Motho;

 

※ The test basis complies with JEDEC Standard No.47 NVCE: Solid State Technology Association Stress-Test-Driven Qualification of Integrated Circuits;

 

※ The design specifications of the test board meet the requirements of the industrial-grade test temperature environment;

 

Information

 

Inner box size W760×D400×H890mm
Outer box size W1870×D890×H1830mm
volume 270L
Opening method Single door (right open)
cooling method air-cooled
weight about 950KG
power supply AC 380V About 7.5 KW

 

Temperature Parameter

temperature range -70℃~150℃
Temperature fluctuation

≤±0.5℃

≤±1℃

temperature offset ≤±2℃
temperature resolution 0.01℃
Heating rate 5℃/min(mechanical cooling, under standard load)
temperature change rate

High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear

Adjustable (measured at the air outlet, mechanical cooling, under normal load)

temperature uniformity ≤±2℃
standard load 10KG aluminum block, 500W load;

 

Test Standard

GB/T5170.2-2008 Temperature test equipment

 

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

 

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

 

GJBl50.3 (MIL-STD-810D) high temperature test method.

 

GJBl50.4 (MIL-STD-810D) low temperature test method.

 

Control System

Display Color LCD display
Operation mode Program mode, fixed value mode
Setting Chinese and English menu (optional), touch screen input
Setting range Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C)

 

display resolution

Temperature: 0.01°C

Time: 0.01min

 

 

control method

BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment)

BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment)

 

Curve record function

It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min)

 

 

 

Accessory function

Fault alarm and cause, processing prompt function

Power-off protection function

Upper and lower limit temperature protection function

Calendar timing function (automatic start and automatic stop operation)

self-diagnosis function

 

Contact Details
Hai Da Labtester

Contact Person: Kelly

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