|
Product Details:
|
| Inner Box Size: | W620×D450×H1100mm | Inner Box Volume: | 460L |
|---|---|---|---|
| Cooling Method: | Air-cooled | Weight: | About 900KG |
| High Light: | High Temperature Accelerated Aging Chamber,Customized Accelerated Aging Chamber |
||
Customized High And Low Temperature Accelerated Aging Chamber
Feature
The whole machine test system mainly includes high and low temperature box, PC main board, PM board, chip board, FPGA board, product tooling, rear warehouse TEST PC and test software, etc. The hardware part.
SSD Intelligent Test System Overview
The intelligent test system of SSD adopts the Win10 operating system platform, through the open script mode, the temperature of the high and low temperature box and the test items of PCIE products can be modified arbitrarily, and the data transmission is carried out through the LINUX system and the network switch to realize one-button operation, networked control, saving labor, realizing intelligent data management, and permanently retaining test results.
Information
| product model | HD-64-PCIE |
| Inner box size | W620×D450×H1100mm |
| Outer box size | 约 W1640×D1465×H1875mm(integrated machine)) |
| Inner box volume | 460L |
| Opening method | Single door (right open) |
| cooling method | air-cooled |
| weight | about 900KG |
| power supply | AC 220V about 6.5 KW |
Temperature Parameter
| temperature range | -5℃~100℃ |
| Temperature fluctuation |
≤±0.5℃ ≤±1℃ |
| temperature offset | ≤±2℃ |
| temperature resolution | 0.01℃ |
| Heating rate | 5℃/min (mechanical cooling, under standard load) |
| temperature change rate |
High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load) |
| temperature uniformity | ≤±2℃ |
| standard load | 10KG aluminum block, 500W load; |
Test Standard
|
GB/T5170.2-2008 Temperature test equipment
GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.
GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.
GJBl50.3 (MIL-STD-810D) high temperature test method.
GJBl50.4 (MIL-STD-810D) low temperature test method. |
Control System
| Display | Color LCD display |
| Operation mode | Program mode, fixed value mode |
| Setting | Chinese and English menu (optional), touch screen input |
| Setting range | Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C) |
|
display resolution |
Temperature: 0.01°C Time: 0.01min |
|
control method |
BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment) BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment) |
|
Curve record function |
It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min) |
|
Accessory function |
Fault alarm and cause, processing prompt function Power-off protection function Upper and lower limit temperature protection function Calendar timing function (automatic start and automatic stop operation) self-diagnosis function |
Contact Person: Kelly
